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 BSS138
GENERAL FEATURES
VDS = 50V,ID = 0.22A RDS(ON) < 6 @ VGS=4.5V RDS(ON) < 3.5 @ VGS=10V ESD Rating1000V HBM High Power and current handing capability Lead free product is acquired Surface Mount Package Schematic diagram
APPLICATION
Direct Logic-Level Interface: TTL/CMOS Drivers: Relays, Solenoids, Lamps, Hammers,Display, Memories, Transistors, etc. Battery Operated Systems Solid-State Relays Marking and pin Assignment
SOT-23 top view
PACKAGE MARKING AND ORDERING INFORMATION Device Marking Device Device Package Reel Size
BSS138 BSS138 SOT-23 O180mm
Tape width
8 mm
Quantity
3000 units
ABSOLUTE MAXIMUM RATINGS(TA=25unless otherwise noted) Parameter Symbol
Drain-Source Voltage Gate-Source Voltage Drain Current-Continuous@ Current-Pulsed (Note 1) Maximum Power Dissipation Operating Junction and Storage Temperature Range
Limit
50 20 0.22 0.88 0.36 -55 To 150
Unit
V V A A W
VDS VGS ID IDM PD TJ,TSTG
THERMAL CHARACTERISTICS
Thermal Resistance,Junction-to-Ambient (Note 2) RJA 350 /W
ELECTRICAL CHARACTERISTICS (TA=25unless otherwise noted) Parameter Symbol Condition
OFF CHARACTERISTICS Drain-Source Breakdown Voltage BVDSS VGS=0V ID=250A
Min
50
Typ
Max
Unit
V
(c)Silikron Semiconductor CO.,LTD.
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BSS138
Zero Gate Voltage Drain Current Gate-Body Leakage Current Gate-Source Breakdown Voltage ON CHARACTERISTICS (Note 3) Gate Threshold Voltage Drain-Source On-State Resistance Forward Transconductance DYNAMIC CHARACTERISTICS (Note4) Input Capacitance Output Capacitance Reverse Transfer Capacitance SWITCHING CHARACTERISTICS (Note 4) Turn-on Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge DRAIN-SOURCE DIODE CHARACTERISTICS Diode Forward Voltage (Note 3) VSD VGS=0V,IS=0.44A 1.4 V td(on) tr td(off) tf Qg Qgs Qgd VDS=25V,ID=0.22A,VGS=10V VDD=30V,VGS=10V, RGEN=6ID=0.22A 2.6 9 20 6 1.7 0.1 0.4 2.4 nC nS Clss Coss Crss VDS=25V,VGS=0V, F=1.0MHz 30 15 6 PF VGS(th) RDS(ON) gFS VDS=VGS,ID=1mA VGS=10V, ID=0.22A VGS=4.5V, ID=0.22A VDS=10V,ID=0.22A 0.1 0.8 1.5 3.5 6 V S IDSS IGSS BVGSO VDS=30V,VGS=0V VDS=50V,VGS=0V VGS=20V,VDS=0V VDS=0V, IG=250uA 20 100 1 10 nA A uA V
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature. 2. Surface Mounted on FR4 Board, t 10 sec. 3. Pulse Test: Pulse Width 300s, Duty Cycle 2%. 4. Guaranteed by design, not subject to production testing.
(c)Silikron Semiconductor CO.,LTD.
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BSS138
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
Vdd Rl D G S Vout
td(on) ton tr
90%
td(off)
toff tf
90%
Vin Vgs Rgen
VOUT
10%
INVERTED
10% 90%
VIN
10%
50%
50%
PULSE WIDTH
Figure 1:Switching Test Circuit
Figure 2:Switching Waveforms
TJ-Junction Temperature()
ID- Drain Current (A
PD Power(W)
TJ-Junction Temperature()
Figure 3 Power Dissipation
Figure 4 Drain Current
Rdson On-Resistance()
ID- Drain Current (A)
Vds Drain-Source Voltage (V)
ID- Drain Current (A)
Figure 5 Output CHARACTERISTICS
Figure 6 Drain-Source On-Resistance
(c)Silikron Semiconductor CO.,LTD.
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BSS138
Normalized On-Resistance Vgs Gate-Source Voltage (V)
ID- Drain Current (A)
TJ-Junction Temperature()
Figure 7 Transfer Characteristics
Figure 8 Drain-Source On-Resistance
Rdson On-Resistance()
C Capacitance (pF)
Vgs Gate-Source Voltage (V)
Vds Drain-Source Voltage (V)
Figure 9 Rdson vs Vgs
Figure 10 Capacitance vs Vds
Vgs Gate-Source Voltage (V)
Qg Gate Charge (nC)
Is- Reverse Drain Current (A)
Vsd Source-Drain Voltage (V)
Figure 11 Gate Charge
(c)Silikron Semiconductor CO.,LTD.
Figure 12 Source- Drain Diode Forward
4
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BSS138
ID- Drain Current (A)
Vds Drain-Source Voltage (V)
Figure 13
Safe Operation Area
r(t),Normalized Effective Transient Thermal Impedance
Square Wave Pluse Duration(sec)
Figure 14 Normalized Maximum Transient Thermal Impedance
(c)Silikron Semiconductor CO.,LTD.
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BSS138
SOT-23 PACKAGE INFORMATION
Dimensions in Millimeters (UNIT:mm)
Symbol A A1 A2 b c D E E1 e e1 L L1 NOTES
Dimensions in Millimeters MIN. MAX. 0.900 1.150 0.000 0.100 0.900 1.050 0.300 0.500 0.080 0.150 2.800 3.000 1.200 1.400 2.250 2.550 0.950TYP 1.800 2.000 0.550REF 0.300 0.500 0 8
1. All dimensions are in millimeters. 2. Tolerance 0.10mm (4 mil) unless otherwise specified 3. Package body sizes exclude mold flash and gate burrs. Mold flash at the non-lead sides should be less than 5 mils. 4. Dimension L is measured in gauge plane. 5. Controlling dimension is millimeter, converted inch dimensions are not necessarily exact.
(c)Silikron Semiconductor CO.,LTD.
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BSS138
SOT 23 Tape and Reel Information
Dimensions in Millimeters (UNIT:mm)
NOTES
1. 2. 3. All dimensions are in millimeters. 10 Sprocket hole pitch cumulative tolerance 0.20MAX General tolerance 0.25
(c)Silikron Semiconductor CO.,LTD.
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BSS138
ATTENTION:
Any and all Silikron products described or contained herein do not have specifications that can handle applications that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with your Silikron representative nearest you before using any Silikron products described or contained herein in such applications. Silikron assumes no responsibility for equipment failures that result from using products at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in products specifications of any and all Silikron products described or contained herein. Specifications of any and all Silikron products described or contained herein stipulate the performance, characteristics, and functions of the described products in the independent state, and are not guarantees of the performance, characteristics, and functions of the described products as mounted in the customer's products or equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test devices mounted in the customer's products or equipment. Silikron Semiconductor CO.,LTD. strives to supply high-quality high-reliability products. However, any and all semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents or events cannot occur. Such measures include but are not limited to protective circuits and error prevention circuits for safe design, redundant design, and structural design. In the event that any or all Silikron products(including technical data, services) described or contained herein are controlled under any of applicable local export control laws and regulations, such products must not be exported without obtaining the export license from the authorities concerned in accordance with the above law. No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise, without the prior written permission of Silikron Semiconductor CO.,LTD. Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for volume production. Silikron believes information herein is accurate and reliable, but no guarantees are made or implied regarding its use or any infringements of intellectual property rights or other rights of third parties. Any and all information described or contained herein are subject to change without notice due to product/technology improvement, etc. When designing equipment, refer to the "Delivery Specification" for the Silikron product that you intend to use. This catalog provides information as of Dec, 2008. Specifications and information herein are subject to change without notice.


(c)Silikron Semiconductor CO.,LTD.
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